Elta LE100 Specifikace Strana 40
- Strana / 254
- Tabulka s obsahem
- KNIHY
Hodnocené. / 5. Na základě hodnocení zákazníků
PL 3120/PL 3150/PL 3170 Power Line Smart Transceiver Data Book 33
V
SS
Drive Out
SERVICE~ Pin
Signal Out
Firmware
Samples
For driving a 50% duty cycle output.
Waveform is sampled for external ground condition.
20 mA
Sink
Broadcast
ID
Config
Pull-Up
LED
SERVICE~
V
DD
Three-
State
Low Low Low
Three-
State
Three-
State
PL 3120/3150 Smart Transceiver
Figure 2.11 PL Smart Transceiver SERVICE~ Circuit
Table 2.10 Service LED Behavior During Different States
Device State
0xF015
State Code Service LED
Applicationless and Unconfigured 3 On
Unconfigured (but with an Application) 2 Flashing
Configured, Hard Offline 6 Off
Configured 4 Off
PL 3150 Defective External Memory — On
The SERVICE~ pin is active low and the service pin message is sent at most once per SERVICE~ pin transition. The
service pin message goes into the next available priority or non-priority output network buffer. Devices in the
applicationless state that do not have an external pullup will transmit the SERVICE~ pin message after every reset.
- /PL 3150 1
- /PL 3170 1
- Table of Contents 3
- Product Overview 9
- LONWORKS Networks 9
- Three Product Families 10
- Power Line Signaling 10
- Restricted 11
- Forward Error Correction 12
- Powerful Output Amplifier 12
- Wide Dynamic Range 12
- Low Current Consumption 12
- Restrictions Under 13
- Consideration 13
- Overview 17
- Table 2.5 ALU Instructions 22
- Memory Allocation Overview 23
- • Unique 48-bit Neuron ID 24
- Static RAM 26
- Pre-programmed ROM 26
- Input/Output 27
- Clock Input 28
- PL Smart 29
- Transceiver 29
- Connections 30
- TXON Output Signal 30
- Additional Functions 31
- RESET~ Pin 32
- Reset Processes and Timing 34
- SERVICE~ Pin 39
- Signal Out 40
- Integrity Mechanisms 41
- Reset Processing 43
- Signatures 43
- Hardware Considerations 46
- Pulsecount Input 50
- I/O Timing Issues 51
- Direct I/O Objects 53
- Byte Input/Output 55
- Leveldetect Input 56
- Nibble Input/Output 57
- Parallel I/O Objects 58
- Parallel Input/Output 60
- Serial I/O Objects 66
- C Input/Output 68
- Magcard Input 70
- Magtrack1 Input 72
- Magcard Bitstream Input 73
- Serial Input/Output 77
- Touch Input/Output 79
- Wiegand Input 81
- SCI (UART) Input/Output 82
- SPI Input/Output 83
- IO_7 input bit io_p7_in; 84
- 1 = clockedge(+) 85
- 0 = clockedge(-) 85
- 1 = [default] 85
- 0 = invert 85
- SPI Master 87
- SPI Master (Neurowire 87
- SPI Slave 88
- Timer/Counter Input Objects 89
- Dualslope Input 90
- Edgelog Input 91
- Infrared Input 93
- Ontime Input 94
- Period Input 94
- Reference Figure 3.40 95
- Quadrature Input 97
- Return from function 88 µs 98
- Totalcount Input 99
- Timer/Counter Output Objects 100
- Frequency Output 102
- Infrared Pattern Output 103
- Oneshot Output 104
- Pulsecount Output 105
- Pulsewidth Output 106
- Triac Output 107
- Triggered Count Output 109
- (Clock Select + n) 110
- Clock Select 111
- Introduction 113
- IllinoisCap/154MKP275KB 116
- IllinoisCap/683MKP275KB 120
- IllinoisCap/224MKP275KB 128
- Table 4.12 136
- Coupling Circuit Tutorial 137
- Power Line Coupling Basics 139
- Power Line Coupling Details 141
- Safety Issues 146
- Ground Leakage Currents 148
- 3-Phase Coupling Circuits 149
- Line Surge Protection 155
- Transmission 164
- Retransmit 164
- Power Supply 166
- PL 3120/ PL 3170 167
- Reference Design 167
- (See Appendix A) 167
- 12.6 VAC @100 mA 168
- (See Text) 172
- Optional 172
- Quasi-peak detector 181
- Average detector 181
- Frequency (Hz) 186
- Attenuation (dB) 186
- Conducted Emissions Testing 194
- EMI Remedies 195
- Verification Procedure 201
- Power Line Test Isolator 202
- Test Equipment 202
- 30.1k Ω ±1%, 1/4W 204
- Good Citizen Verification 205
- ISOLATOR 207
- Checks 213
- Dual Carrier Frequency Mode 215
- CENELEC Access Protocol 215
- Power Management 216
- Standard Transceiver Types 217
- Development Tools Support 218
- ShortStack Developer’s Kit 220
- Reference Design Files 225
- (DSK) Reference Designs 227
- Device Checklist 232
- Ω @100kHz 234
- Schematic 239
- Production Test Guidelines 243
- A/D, D/A- based Test System 245
- Test System Verification 247
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